Epsilon X-Ray Fluorescence (XRF)

The Epsilon energy-dispersive (XRF) benchtop spectrometer that performs non-destructive analysis of elements from Na (11) to Am (95) in a variety of different sample types, including solids, liquids, pressed and loose powders, slurries and filters.

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Key Features

• Elemental Composition of Solids, Liquids, and Loose or Pressed Powders for 11 ≤ Z ≤ 95
• Identification of Elemental Impurities with Sensitivity < 1 ppm
• Quantitative Elemental Analysis of Materials using Material Standards or Omnian Standardless Analysis Software Package
• Spectral Energy Resolution ≤ 145 eV
• Elemental Sensitivity:< 1 ppm (by weight)
• Sample size from ~ 100 mg to ~ 1000 g or up to 18 ml or 10 x 20 x 10 cm3 ( H x W x D)

Key Applications and available processes

• Non-destructive Analysis of Metals, Glasses, Ceramics, Plastics, Geologic Materials, Organics, Pharmacuticals, etc.

General Documentation

XRF SOP (standard operation procedure) documents in development

Contact

Dan Lamont 

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Equipment Fee

Characterization Service 4