Fischione Instruments Model 1060 Ion Mill

Key Applications and available processes

  • A state-of-the-art ion milling and polishing system. It is compact, precise, and consistently produces high-quality scanning electron microscopy (SEM) samples for a wide variety of applications.
  • Two independently adjustable TrueFocus ion sources.
  • Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 6 keV).
  • High energy operation for rapid milling; low energy operation for specimen polishing.
  • Adjustable beam diameters.
  • Simple setup of milling parameters.
  • Individual, automatic ion source gas control.
  • Continuously adjustable milling angle range of 0 to +10 ̊ .
  • Sample rocking or rotation.
  • Stereo microscope for direct sample observation.
  • High-magnification microscope and CCD camera.

Key Features

  • Low angle Argon ion milling of bulk samples for scanning electron microscopy and microanalysis, especially by electron backscatter diffraction (EBSD) analysis
  • Ion milling rates typically in the 0 – 10 um/hr range

General Documentation

Fischione Instruments Model 1060 SEM Mill SOP (standard operation procedure)


Daniel Lamont or Matt France

Fischione Instruments Model 1060 Ion Mill

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Equipment Fee

Characterization Add-on 1