Zeiss Sigma 500 VP

Zeiss Sigma 500 VP Analytical FE-SEM with Oxford Microanalysis

Zeiss Sigma 500VP

The Sigma is a field-emission SEM that produces exceptional images at high and low accelerating voltages. Together with its analytical capabilities, this instrument is suitable for a wide range of applications in materials and life science.

Technical Specs:

Electron source: Schottky thermal field emitter
Accelerating voltage range: 0.2 to 30 kV
Current range: 4 pA to 20 nA
Variable pressure range: 2-133 Pa
Detectors: In-lens secondary electron, Everhart-Thornley secondary electron, variable pressure secondary electron, backscattered electron
Resolution at 1 kV/ 15 kV: 2.8 nm/1.5 nm
Maximum image size: 3072 x 2304 pixels
Large sample chamber that can accommodate specimens up to 250 mm diameter and 45 mm tall

Sigma Techniques:

Energy-dispersive X-ray analysis (EDX): 80 mm silicon-drift detector enables rapid determination of elemental compositions and acquisition of compositional maps
Scanning Transmission Electron Microscopy (STEM): Using a specialised detector, bright- and dark-field STEM images can be acquired from thin samplesn-Immersion FESEM Column
High resolution field emission-SEM column, with:
High stability Schottky field emission gun
Beam current range: 1 pA to 400 nA
Accelerating voltage range: 200 eV – 30 keV

Safety and Training Requirements:

This device requires on-site, in person training prior to use.

Click here for manual.

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