Transmission Electron Microscope (TEM)Divider

JEOL JEM-2100F Transmission Electron Microscope (TEM) with Gatan GIF-Tridiem, EELS and Oxford Inca XEDS

This HR-TEM combine the capabilities for routine atomic resolution imaging of crystal lattices by coherent electron scattering or phase contrast (TEM) and incoherent electron scattering or Z-contrast in the scanning transmission electron microscopy (STEM) mode. It is equipped with attachments for XEDS analysis and a GIF TRIDIEM post-column energy filter for acquisition of energy-filtered images and diffraction.

Technical Specs:

  • Schottky field-emission gun (FEG) 120 kV to 200 kV
  • ≤35° X- & Y-tilt
  • Special Resolution: 
    • 0.23 nm point resolution (TEM)
  • Lattice Resolution: 
    • 0.1nm (TEM)
    • 0.2nm (STEM)
  • Probe size: 
    • 0.5 (TEM mode) 
    • 0.16 nm (STEM mode)
  • XEDS allows for detection of beryllium or heavier elements (atomic number Z ≥ 4)
  • EELS resolution of 1.05 eV @ 200 kV
    • 180 µA emission current
  • EELS resltuion of 0.63 eV @ 200 kV
    • 40 µA emission current
  • Can be operated remotely via the University of Pittsburgh network
  • Capabilities: TEM, STEM, EDS, EELS, EFTEM, EELS SI, OIM (A-Star), in situ nanoindentation with hysitron picoindentor.


Safety and Training Requirements:

This device requires on-site, in person training prior to use.

Prior to usage of equipment review the following safety pages and Cryogens SOP.



Photo of the TEM

Facility: Characterization
Location: SB 62A

User Guide

New User? See sign up instructions here.
Existing User? Link to FOM here.

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Supervisor: Susheng Tan

Phone: 412-383-5978
Email: sut6@pitt.edu



Co-Supervisor: Mike McDonald

Phone: 412-383-5977
Email: mlm97@pitt.edu



General Contact Info:
Facility Phone: 412-383-8001
Facility Email: nfcf@nano.pitt.edu

Benedum Hall
3700 O'Hara Street
Pittsburgh, PA 15261
NFCF Lab, SB 60-63