Transmission Electron Microscope (TEM)
JEOL JEM-2100F Transmission Electron Microscope (TEM) with Gatan GIF-Tridiem, EELS and Oxford Inca XEDS
This HR-TEM combine the capabilities for routine atomic resolution imaging of crystal lattices by coherent electron scattering or phase contrast (TEM) and incoherent electron scattering or Z-contrast in the scanning transmission electron microscopy (STEM) mode. It is equipped with attachments for XEDS analysis and a GIF TRIDIEM post-column energy filter for acquisition of energy-filtered images and diffraction.
Safety and Training Requirements:
This device requires on-site, in person training prior to use.
New User? See sign up instructions here.
Existing User? Link to FOM here.
Emergencies dial 4-2121 for Pitt Police
Supervisor: Susheng Tan
Co-Supervisor: Mike McDonald
General Contact Info: