SPM

Scanning Probe Microscope   (SPM)

Veeco Manifold ‘Multimode V’ & ‘Dimension V’ Combination Scanning Probe Microscope

This combination SPM is controlled by Veeco’s most advanced controller, the Nanoscope V, can generate up to 5120 x 5120 pixel density and acquire & display up to 8 images simultaneously. The Multimode V SPM routinely achieves atomic resolution both in air and liquid while the Dimension V SPM is able to characterize sample in wafer size with sub-nm resolution.

Technical Specs:

• Can generate up to 5120 x 5120 pixel density and acquire up to 8 images simultaneously
• Atomic Force Microscope (AFM)
• Lateral Force Microscope (LFM)
• Magnetic Force Microscope (MFM)
• Electrostatic Force Microscopy (MFM)
• Scanning Capacitance Microscopy (SCM)
• Tunneling and Conducting AFM (TUNA-2)
• Scanning Capacitance Microscopy (SSRM)
• Torsional Force Microscope

Safety and Training Requirements:

This device requires on-site, in person training prior to use.

Prior to usage of equipment review the following safety pages.

Facility: Characterization
Location: SB 60

User Guide

New User? See sign up instructions here.

Existing User? Link to FOM here.

Emergencies dial 4-2121 for Pitt Police

Supervisor: Susheng Tan

Phone: 412-383-5978
Email: sut6@pitt.edu

Co-Supervisor: Mike McDonald

Phone: 412-383-5977
Email: mlm97@pitt.edu

General Contact Info:
Facility Phone: 412-383-8001
Facility Email: nfcfadmn@nano.pitt.edu

Benedum Hall
3700 O'Hara Street
Pittsburgh, PA 15261
NFCF Lab, SB 60-63