Scanning Probe Microscope   (SPM) Divider

Veeco Manifold ‘Multimode V’ & ‘Dimension V’ Combination Scanning Probe Microscope

This combination SPM is controlled by Veeco’s most advanced controller, the Nanoscope V, can generate up to 5120 x 5120 pixel density and acquire & display up to 8 images simultaneously. The Multimode V SPM routinely achieves atomic resolution both in air and liquid while the Dimension V SPM is able to characterize sample in wafer size with sub-nm resolution.


Technical Specs:

  • Can generate up to 5120 x 5120 pixel density and acquire up to 8 images simultaneously
  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Magnetic Force Microscope (MFM)
  • Electrostatic Force Microscopy (MFM)
  • Scanning Capacitance Microscopy (SCM)
  • Tunneling and Conducting AFM (TUNA-2)
  • Scanning Capacitance Microscopy (SSRM)
  • Torsional Force Microscope


Safety and Training Requirements:

This device requires on-site, in person training prior to use.

Prior to usage of equipment review the following safety pages.

Photo of the SPM

Facility: Characterization
Location: SB 60

User Guide

New User? See sign up instructions here.
Existing User? Link to FOM here.

Divider Emergencies dial 4-2121 for Pitt PoliceDivider


Supervisor: Susheng Tan

Phone: 412-383-5978
Email: sut6@pitt.edu



Co-Supervisor: Mike McDonald

Phone: 412-383-5977
Email: mlm97@pitt.edu



General Contact Info:
Facility Phone: 412-383-8001
Facility Email: nfcf@nano.pitt.edu

Benedum Hall
3700 O'Hara Street
Pittsburgh, PA 15261
NFCF Lab, SB 60-63