Instrumentation List
Electron Microscopy
Transmission Electron Microscope (TEM): JEOL JEM-2100F
Scanning Electron Microscope (SEM): JEOL JSM-6510LV/LGS
Electron Probe Micro Analyzer (EPMA): JEOL JXA-8530F
Scanning Probe Microscopy
Scanning Probe Microscopy Station (SPM): Veeco Dimension V and MultiMode V
X-ray Diffraction
High-Sensitivity Modular X-ray Diffraction System: Bruker D8 Discover with GADDS
Spectroscopy
Spectroscopic Phase Modulated Ellipsometer: Horiba Jobin Yvon UVISEL
Microspectrophotometer: CRAIC QDI 2010 UV-Vis-NIR: 200-2100 nm
Fourier Transform Infrared Microscope (FTIR): Bruker VERTEX 70-LS FTIR with HYPERION 2000
Raman Microscope
Raman Microscope: Renishaw inVia