Zeiss SIGMA VP Scanning Electron Microscope

The Sigma is a field-emission SEM that produces exceptional images at both high and low accelerating voltages. Together with its analytical capabilities, this instrument is suitable for a wide range of applications in materials and life science. The microscope is not designated for biological sample imaging, but it is capable and such samples are allowed for certain cases with specific approval from the lab staff.

 

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Key Features

  • Electron source: Schottky thermal field emitter
  • Accelerating voltage range: 0.2 to 30 kV
  • Current range: 4 pA to 20 nA
  • Variable pressure range: 2-133 Pa
  • Detectors: In-lens secondary electron, Everhart-Thornley secondary electron, variable pressure secondary electron, backscattered electron, Scanning Transmission Electron Microscopy (STEM) detector.
  • Resolution at 1 kV/ 15 kV: 2.8 nm/1.5 nm
  • Large sample chamber that can accommodate specimens up to 250 mm diameter and 45 mm tall

 

Photo of the Zeiss SEM

General Documentation 

Zeiss SEM SOP (standard operation procedure)

 

Contact

Michael McDonald and Susheng Tan


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Equipment Fee

Characterization Service 3