Scanning Probe Microscope (SPM/AFM)
Atomic Force microscopy is an imaging and surface probing technique that can be used to determine sample roughness, to perform topographic surface imaging, and to measure a wide range of surface properties as a function of position. 3D imaging is possible for samples with sample height variations of less than 5 microns. Our SPM is controlled by Veeco’s Nanoscope V controller and can generate up to 5120 x 5120 pixel density, as well as acquire and display up to 8 images simultaneously. The Multimode V SPM routinely achieves atomic resolution both in air and liquid while the Dimension V SPM is able to characterize samples of wafer size with sub-nm resolution.
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Key Features
- Can generate up to 5120 x 5120 pixel density and acquire up to 8 images simultaneously
- Atomic Force Microscope (AFM)
- Lateral Force Microscope (LFM)
- Magnetic Force Microscope (MFM)
- Electrostatic Force Microscopy (MFM)
- Scanning Capacitance Microscopy (SCM)
- Tunneling and Conducting AFM (TUNA-2)
- Scanning Capacitance Microscopy (SSRM)
- Torsional Force Microscope
General Documentation
SPM SOP (standard operation procedure)
Contact
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Equipment Fee
Characterization Service 1
