PANalytical Empyrean X-ray Diffractometer
The Empyrean X-ray diffraction analysis system is intended for use in a wide variety of analytical X-ray diffraction applications. It is equipped with modular components which facilitate rapid configuration changes allowing many types of analysis. This system is equipped with a Co anode X-ray tube (Ƙɑ(Å)=1.79028 ), which is particularly suited to powder diffraction of sample containing significant amounts of Fe.
It is typically configured with a 3 motorized-axis Eulerian cradle stage (Phi, Chi, and Z); which is designed for high-resolution diffraction reflectometry, residual stress and texture analysis of thin films or irregularly shaped samples.
The Empyrean is equipped with a versatile PIXcel3D solid state detector which can be used in scanning or static area detector (2D) mode, scanning or static line detector (1D) mode, and receiving slit mode.
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Key Features
- Powder XRD, and Grazing Incidence XRD
- Chi-Phi-Z motorized Eulerian Cradle stage
- Sample specifications:
- 140 mm maximum diameter
- 64 mm maximum height
- 2kg maximum mass
- PIXcel3D (Medipix 2) detector system
Key Applications and available processes
- Phase identification
- Quantitative phase analysis
- X-ray reflectometry of thin layers and substrate materials.
- In-plane diffraction of thin film
- Residual stress and texture analysis
- Micro-Diffraction
General Documentation
TBD
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Equipment Fee
Characterization Service 4