JEOL JEM-2100F Transmission Electron Microscope (TEM) with Gatan GIF-Tridiem, EELS and Oxford XEDS

The Joel JEM2100F is a high resolution TEM which combines routine atomic resolution imaging of crystal lattices via coherent electron scattering or phase contrast (TEM) with incoherent electron scattering (or Z-contrast) in the scanning transmission electron microscopy (STEM) mode. It is equipped with attachments for XEDS analysis and a GIF TRIDIEM post-column energy filter for acquisition of energy-filtered images and diffraction.

……………………………………………………………………………………………………………………………………………………………………………………………………………………………..

Photo of the TEM

Key Features

  • Schottky field-emission gun (FEG) 200 kV
  • ≤35° X- & Y-tilt
  • Resolution: 

                  0.23 nm point to point (TEM)

                  0.1nm Lattice (TEM)

                  0.2nm (STEM)

  • Probe size: 

                  0.5 (TEM mode) 

                  0.16 nm (STEM mode)

  • XEDS allows for detection from Beryllium to Uranium (atomic number Z ≥ 4)
  • EELS resolution of 1.05 eV @ 200 kV, 180 µA emission current
  • EELS resltuion of 0.63 eV @ 200 kV, 40 µA emission current
  • Capabilities: TEM, STEM, EDS, EELS, EFTEM, EELS SI and, in situ nanoindentation with Hysitron picoindentor holder.
  • Holders: single tilt, double tilt, and double tilt low background holder for EDS analysis, Hysitron H-9500 nanoindentor.

  

General Documentation 

JEOL JEM2100F TEM SOP (standard operation procedure)

 

Contact

Susheng Tan

 

Check Availability

Already have an account?

Reserve this tool with the FOM.

Need an Account?

Get Started

 

Equipment Fee

Characterization Service 2