JEOL JEM-2100F Transmission Electron Microscope (TEM) with Gatan GIF-Tridiem, EELS and Oxford Inca XEDS

This HR-TEM combines the capabilities for routine atomic resolution imaging of crystal lattices by coherent electron scattering or phase contrast (TEM) and incoherent electron scattering or Z-contrast in the scanning transmission electron microscopy (STEM) mode. It is equipped with attachments for XEDS analysis and a GIF TRIDIEM post-column energy filter for acquisition of energy-filtered images and diffraction.

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Photo of the TEM

Key Features

  • Schottky field-emission gun (FEG) 120 kV to 200 kV
  • ≤35° X- & Y-tilt
  • Spatial Resolution: 

                  0.23 nm point resolution (TEM)

  • Lattice Resolution: 

                  0.1nm (TEM)

                  0.2nm (STEM)

  • Probe size: 

                  0.5 (TEM mode) 

                  0.16 nm (STEM mode)

  • XEDS allows for detection of beryllium or heavier elements (atomic number Z ≥ 4)
  • EELS resolution of 1.05 eV @ 200 kV

                  180 µA emission current

  • EELS resltuion of 0.63 eV @ 200 kV

                  40 µA emission current

  • Capabilities: TEM, STEM, EDS, EELS, EFTEM, EELS SI, OIM (A-Star) and, in situ nanoindentation with Hysitron picoindentor holder.
  • Holders: single tilt, double tilt, and double tilt low background holder for EDS analysis.

  

General Documentation 

JEOL JEM2100F TEM SOP (standard operation procedure)

 

Contact

Susheng Tan

 

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Equipment Fee

Characterization Service 2