Fischione Instruments Model 1060 Ion Mill
Key Applications and available processes
- A state-of-the-art ion milling and polishing system. It is compact, precise, and consistently produces high-quality scanning electron microscopy (SEM) samples for a wide variety of applications.
- Two independently adjustable TrueFocus ion sources.
- Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 6 keV).
- High energy operation for rapid milling; low energy operation for specimen polishing.
- Adjustable beam diameters.
- Simple setup of milling parameters.
- Individual, automatic ion source gas control.
- Continuously adjustable milling angle range of 0 to +10 ̊ .
- Sample rocking or rotation.
- Stereo microscope for direct sample observation.
- High-magnification microscope and CCD camera.
Key Features
- Low angle Argon ion milling of bulk samples for scanning electron microscopy and microanalysis, especially by electron backscatter diffraction (EBSD) analysis
- Ion milling rates typically in the 0 – 10 um/hr range
General Documentation
Fischione Instruments Model 1060 SEM Mill SOP (standard operation procedure)
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