Fischione Instruments Model 1050 TEM Mill
Key Features
- A state-of-the-art ion milling and polishing system. It is compact, precise, and consistently produces high-quality transmission electron microscopy (TEM) specimens with large electron transparent areas from a wide variety of materials.
- Two independently adjustable TrueFocus ion sources.
- High energy operation for rapid milling; low energy operation for specimen polishing.
- Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 6 keV).
- Simple setup of milling parameters.
- Individual, automatic ion source gas control.
- Continuously adjustable milling angle range of -10 to +10 ̊
- Specimen rocking or rotation with ion beam sequencing.
- Automatic termination.
- Liquid nitrogen-cooled specimen stage.
Key Applications and available processes
- Single or double sided thinning of materials for transmission electron microscopy
- Argon ion milling rates typically in the 0 – 10 um/hr range
General Documentation
Fischione Instruments Model 1050 TEM Mill SOP (standard operation procedure)
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